Title: X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons
Publisher: Springer Berlin Heidelberg
Publication Date: 2011
Language: English
ISBN 10: 364274804X
ISBN 13: 9783642748042
Binding: Paperback
Condition: Brand New
Weight: 0.55 kilograms

About this title

Synopsis

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Language Notes

Text: English (translation)
Original Language: French

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