X-Ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis

Chung, Deborah D; Detlaven, Patrick W; Arnold, H; Ghosh, Debastis

ISBN 10: 3527278427 ISBN 13: 9783527278428
Published by Wiley-VCH, 1993
Language: English
Condition: Used - Fine Hardcover

Sold by Buchpark, Trebbin, Germany

AbeBooks Seller since September 30, 2021

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


Used - Hardcover

Condition: Used - Fine

Price:
US$ 63.15
US$ 123.22 shipping
Ships from Germany to U.S.A.

Quantity: 1 available

Add to basket