X-Ray Diffraction Topography: International Series in the Science of the Solid State

B. K. Tanner

ISBN 10: 1483171876 / ISBN 13: 9781483171876

Published by Pergamon, 2013

About this Item

188 pages. 10.25x7.00x0.43 inches. In Stock.

Seller Inventory # zk1483171876

Bibliographic Details

• Title: X-Ray Diffraction Topography: International Series in the Science of the Solid State
• Publisher: Pergamon
• Publication Date: 2013
• Language: English
• ISBN 10: 1483171876
• ISBN 13: 9781483171876
• Binding: Paperback
• Condition: Brand New
• Weight: 0.44 kilograms

About this title

Synopsis

X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.