X-Ray Microscopy and X-Ray Microanalysis. Proceedings of the Second International Symposium Stockholm 1960.

Engström, A. et al. (eds):

Published by Elsevier, Amsterdam, 1960
Language: German
Condition: Used Hardcover

Sold by Antiquariat Silvanus - Inhaber Johannes Schaefer, Ahrbrück, Germany

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Used - Hardcover

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