X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Würzburg, August 19¿23, 1996

Jürgen Thieme

ISBN 10: 3642721087 / ISBN 13: 9783642721083

Published by Springer Berlin Heidelberg, 2014

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.

Seller Inventory # 9783642721083

Bibliographic Details

• Title: X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Würzburg, August 19¿23, 1996
• Publisher: Springer Berlin Heidelberg
• Publication Date: 2014
• Language: English
• ISBN 10: 3642721087
• ISBN 13: 9783642721083
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 23D millimeters 235 millimeters width by 155 millimeters height by 23 millimeters depth
• Weight: 616 grams

About this title

Synopsis

This book is based on presentations to the International Conference of X-Ray Micro­ scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X­ rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci­ plinary and cooperative character of this field and the growing demand for micro­ scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.

From the Back Cover

This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.