X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Wurzburg, August 19 23, 1996

Jurgen Thieme, Gunter Schmahl, Dietbert Rudolph

ISBN 10: 3642721087 ISBN 13: 9783642721083
Published by Springer 2014-08-23, 2014
Language: English
Condition: New Soft cover

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