X-Ray Optics and Microanalysis 1992. Institute of Physics Conference Series Number 130.

Proceedings of the Thirteenth International Congress, UMIST, 31 August - 4 September 1992. Papers from many contributors arranged in the general headings of: Cosslett Symposium; Electron Probe Microanalysis; Analytical Electron Microscopy; Complementary Microscopy; Image Processing; Surface Analysis and Imaging; X-ray Sources, Optics and Imaging; Synchrotron Radiation Sources and their Application; Highlights of Congress (someone had a sense of humour?). Hardbound, 8vo, 652pp incl. index. As new in newly protected dustjacket. For non-UK mailings extra postage will be needed. Proceedings of the Thirteenth International Congress, UMIST, 31 August - 4 September 1992. Papers from many contributors arranged in the general headings of: Cosslett Symposium; Electron Probe Microanalysis; Analytical Electron Microscopy; Complementary Microscopy; Image Processing; Surface Analysis and Imaging; X-ray Sources, Optics and Imaging; Synchrotron Radiation Sources and their Application; Highlights of Congress (someone had a sense of humour?). Hardbound, 8vo, 652pp incl. index. As new in newly protected dustjacket, as new. For non-UK mailings extra postage will be needed.