X-Ray Spectroscopy for Chemical State Analysis

Jun Kawai

ISBN 10: 9811973636 / ISBN 13: 9789811973635

Published by Springer, Springer Nature Singapore, 2023

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical interpretations of X-ray spectra along with experimental techniques needed for both synchrotron radiation users and laboratory experimentalists. Presenting not only practical information, this book also covers basic knowledge of commercially available spectrometers and the basic physics of optics and electromagnetism related to X-rays. Furthermore, the author introduces the forgotten history of X-ray physics in the beginning of twentieth century. This book is of use for researchers studying catalysts, charge-transfer materials, surface characterization, and toxic trace elements via X-ray spectroscopy for chemical state analysis as well as quantitative analysis.

Seller Inventory # 9789811973635

Bibliographic Details

• Title: X-Ray Spectroscopy for Chemical State Analysis
• Publisher: Springer, Springer Nature Singapore
• Publication Date: 2023
• Language: English
• ISBN 10: 9811973636
• ISBN 13: 9789811973635
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 13D millimeters 235 millimeters width by 155 millimeters height by 13 millimeters depth
• Weight: 421 grams

About this title

Synopsis

This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical interpretations of X-ray spectra along with experimental techniques needed for both synchrotron radiation users and laboratory experimentalists. Presenting not only practical information, this book also covers basic knowledge of commercially available spectrometers and the basic physics of optics and electromagnetism related to X-rays. Furthermore, the author introduces the forgotten history of X-ray physics in the beginning of twentieth century. This book is of use for researchers studying catalysts, charge-transfer materials, surface characterization, and toxic trace elements via X-ray spectroscopy for chemical state analysis as well as quantitative analysis.

About the Author

Jun Kawai studies X-ray physics and chemistry, since 1981, when he joined Prof. Gohshi's laboratory, the University of Tokyo, in order to study the chemical effects of X-ray emission spectra, then moved to Institute for Molecular Science for the theoretical studies of the solid state effects of X-ray spectra, then moved to the Institute of Industrial Science, the University of Tokyo, for the development of X-ray photoelectron diffraction, then moved to RIKEN (The Institute of Physical and Chemical Research) as postdoctoral fellow for studying the total reflection X-ray photoelectron spectroscopy (XPS) as well as particle-induced X-ray emission (PIXE), and then moved to Kyoto University, where he studies radiative Auger effect, X-ray fluorescence holography, blackbody radiation, pyroelectric X-ray generation, polarization of Compton scattering, and so on. He teaches "Quantum Spectrochemistry" in Kyoto University, and the present book is partly based on this lecture.  He has beenan associate editor of a journal "X-Ray Spectrometry" from Wiley and was a member of the editorial advisory board of "Spectrochimica Acta Part B: Atomic Spectroscopy" from Elsevier for more than 20 years.