Ricardo Reis
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Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Posser, Gracieli; Sapatnekar, Sachin S.; Reis, Ricardo
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Soft Error Reliability Using Virtual Platforms: Early Evaluation of Multicore Systems
Rocha Da Rosa, Felipe; Ost, Luciano; Reis, Ricardo
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Protecting Chips Against Hold Time Violations Due to Variability
Neuberger, Gustavo; Wirth, Gilson; Reis, Ricardo
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View 22 offersUS$ 103.29
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