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Da Silva, Francisco; Mclaurin, Teresa; Waayers, Tom (24 results)
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Condition: New. pp. 312.
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Condition: New. pp. 312 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. pp. 312.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 141.51
US$ 15.81 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 308.
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 182.28
US$ 15.81 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 182.27
US$ 19.79 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Condition: As New. Unread book in perfect condition.
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Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 206.81
US$ 19.79 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Paperback. Condition: Like New. Like New. book.
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Gebunden. Condition: New. Guides engineers through the process of building a 1500 wrapperProvides insight into the rules and recommendations of IEEE Std. 1500 Focus on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choice.
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The Core Test Wrapper Handbook
Published by Springer-Verlag New York Inc., US, 2006
ISBN 10: 0387307516 ISBN 13: 9780387307510
Language: English
US$ 254.01
US$ 85.76 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. 2006 ed. In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Guides engineers through the process of building a 1500 wrapperProvides insight into the rules and recommendations of IEEE Std. 1500 Focus on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choice.
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Condition: New. Print on Demand pp. 308.
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Condition: New. PRINT ON DEMAND pp. 308.
