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Sachdev, Manoj; Gyvez, Jose Pineda De (20 results)
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hardcover. Condition: As New. 2nd. Ships Out Tomorrow!
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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US$ 45.14
Convert currencyUS$ 121.44 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: New. pp. 352 2nd Edition.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 183.79
Convert currencyUS$ 15.94 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 201.35
Convert currencyUS$ 8.65 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: New. pp. 352 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New.
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US$ 230.23
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Condition: New.
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US$ 230.69
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 262.02
Convert currencyUS$ 15.94 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 256.24
Convert currencyUS$ 33.26 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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US$ 348.57
Convert currencyUS$ 33.26 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 2nd edition. 349 pages. 9.10x6.10x0.90 inches. In Stock.
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US$ 351.59
Convert currencyUS$ 33.26 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 2nd edition. 328 pages. 9.25x6.25x0.75 inches. In Stock.
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US$ 356.26
Convert currencyUS$ 33.26 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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US$ 214.52
Convert currencyUS$ 56.66 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.
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US$ 214.52
Convert currencyUS$ 56.66 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.
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US$ 356.99
Convert currencyUS$ 11.51 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 352.
