Ubar (57 results)

Language: English
Published by B E S Pub Co (edition Later Printing; First Printing), 1999
- Hardcover
Seller: BooksRun, Philadelphia, PA, U.S.A.BooksRun
Contact seller5-star sellerCondition: Used - Very good
US$ 8.49
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Hardcover. Condition: Very Good. Later Printing; First Printing. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
the feather men ppb1st1997 TRUE sas memoir fair later killer elite movie sas vengeance on arab royal
Published by penguin, 1997
- First Edition
Seller: forest primeval, cherry tree, PA, U.S.A.forest primeval
Contact seller2-star sellerfair. fair.
Published by Berlin VEB Verlag Technik, 1989
- Softcover
Seller: Grammat Antiquariat, Oberbarnim, GermanyGrammat Antiquariat
Contact seller5-star sellerCondition: Used
US$ 14.14
US$ 14.87 shippingShips from Germany to U.S.A.Quantity: 1 available
kart.. 1. 1. Aufl., gr. 8°, S.: 216, Ill., kart., Ecken und Ränder bestoßen und fleckig, Seiten angegilbt und fleckig sonst gut erhalten, Sprache: Deutsch 0,340 gr.

Seller: medimops, Berlin, Germanymedimops
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US$ 4.53
US$ 11.44 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.
Published by VEB Verlag Technik, Berlin, 1989, 1989
- Softcover
Seller: Versandantiquariat Kerzemichel, Wittenberge, GermanyVersandantiquariat Kerzemichel
Contact seller5-star sellerCondition: Used
US$ 11.79
US$ 33.18 shippingShips from Germany to U.S.A.Quantity: 1 available
215 S., 8°, Obrosch, 1. Auflg., mit 96 Bildern und 17 Tafeln, ehemaliges Bibliotheksexemplar, Stempel au Vs., Vorwort von den Herausgebern, sehr gut.

- Softcover
Seller: Ammareal, Morangis, FranceAmmareal
Contact seller5-star sellerCondition: Used - Fine
Original price: US$ 67.16; 10% offCurrent price: US$ 60.45
US$ 18.88 shippingShips from France to U.S.A.Quantity: 1 available
Softcover. Condition: Très bon. Ancien livre de bibliothèque avec équipements. Tome 1. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Volume 1. Ammareal gives back up to 15% of this item's net price to charity orga…nizations.

- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 132.11
US$ 13.39 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 180 pages. 8.66x5.91x0.41 inches. In Stock.

- Softcover
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
US$ 64.70
US$ 80.09 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Software-Based Self-Test with Decision Diagrams for Microprocessors | Raimund Ubar (u. a.) | Taschenbuch | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786137339473 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de |… Anbieter: preigu.

- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
US$ 166.93
US$ 33.49 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 197.15
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
Contact seller5-star sellerCondition: New
US$ 200.86
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 209.97
US$ 16.05 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.

Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 215.19
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Condition: New.

Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 209.95
US$ 20.09 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.

- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 225.41
US$ 3.99 shippingShips within U.S.A.Quantity: 1 available
Condition: New. 1st ed. 2024 edition NO-PA16APR2015-KAP.

- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
US$ 235.48
US$ 8.71 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: New.

Design and Test Technology for Dependable Systems-on-Chip
Ubar, Raimund (EDT); Raik, Jaan (EDT); Vierhaus, Heinrich Theodor (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 235.17
US$ 20.09 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
US$ 251.70
US$ 11.38 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: New.

- Softcover
Seller: Rarewaves USA, OSWEGO, IL, U.S.A.Rarewaves USA
Contact seller5-star sellerCondition: New
US$ 259.01
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Paperback. Condition: New. Illustrated.

- Hardcover
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
Contact seller5-star sellerCondition: New
US$ 261.86
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Hardcover. Condition: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two typ…es of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

- Hardcover
- International Edition
Seller: UK BOOKS STORE, London, LONDO, United KingdomUK BOOKS STORE
Contact seller5-star sellerInternational EditionCondition: New
US$ 276.42
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Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if th…e Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.

- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 275.91
US$ 20.09 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.

- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 286.19
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.

- Softcover
Seller: Rarewaves USA United, OSWEGO, IL, U.S.A.Rarewaves USA United
Contact seller5-star sellerCondition: New
US$ 270.87
US$ 50.00 shippingShips within U.S.A.Quantity: Over 20 available
Paperback. Condition: New. Illustrated.

- Softcover
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
US$ 239.06
US$ 80.09 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Structural Decision Diagrams in Digital Test | Theory and Applications | Raimund Ubar (u. a.) | Taschenbuch | Computer Science Foundations and Applied Logic | xiii | Englisch | 2025 | Springer | EAN 9783031447365 | Verantwortliche Person für die EU: Springer Basel AG in Springer Science + Business Me…dia, Heidelberger Platz 3, 14197 Berlin, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

- Softcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
Contact seller5-star sellerCondition: New
US$ 316.90
Free ShippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Paperback. Condition: New. Illustrated.

- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 315.59
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 277.41
US$ 75.44 shippingShips from Germany to U.S.A.Quantity: 1 available
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces…and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.

Language: English
Published by Springer Nature Switzerland, Springer Nature Switzerland, 2025
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 277.41
US$ 74.52 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book intr…oduces and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.

- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 362.29
US$ 3.99 shippingShips within U.S.A.Quantity: 4 available
Condition: New.