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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Random Telegraph Signals in Semiconductor Devices
Book 16 of 72: IOP Expanding PhysicsSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 121.92
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Very Good. 1st Edition. Very good, clean, tight condition. Text free of marks. Some spotting on cover. Professional book dealer since 1999. All orders are processed promptly and carefully packaged with tracking.
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Random Telegraph Signals in Semiconductor Devices
Book 16 of 72: IOP Expanding PhysicsSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 135.01
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Germanium-Based Technologies: From Materials to Devices
Language: English
Published by Elsevier Science 2007-03-23, 2007
ISBN 10: 0080449530 ISBN 13: 9780080449531
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US$ 134.92
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US$ 188.94
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Add to basketCondition: New. pp. xxiv + 449 Illus.
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Extended Defects in Germanium: Fundamental and Technological Aspects (Springer Series in Materials Science, 118)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270)
Book 185 of 233: Springer Series in Materials ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270)
Book 185 of 233: Springer Series in Materials ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
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Germanium-Based Technologies: From Materials to Devices
Language: English
Published by Elsevier Science Ltd, 2007
ISBN 10: 0080449530 ISBN 13: 9780080449531
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Add to basketHardcover. Condition: Brand New. 1st edition. 480 pages. 9.75x6.75x1.25 inches. In Stock.
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Condition: New. pp. xxiv + 449.
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Condition: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
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Fundamental and Technological Aspects of Extended Defects in Germanium
Language: English
Published by Springer-Verlag Berlin And Heidelberg Gmbh & Co. Kg, 2009
ISBN 10: 3540856110 ISBN 13: 9783540856115
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Add to basketHardcover. Condition: Brand New. 1st edition. 320 pages. 9.75x6.75x0.75 inches. In Stock.
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US$ 265.51
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US$ 284.97
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US$ 300.64
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Add to basketPaperback. Condition: Brand New. 476 pages. 9.45x6.50x1.12 inches. In Stock.
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, 270)
Book 185 of 233: Springer Series in Materials ScienceUS$ 297.48
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Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact
Book 185 of 233: Springer Series in Materials ScienceUS$ 322.78
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Add to basketHardcover. Condition: Brand New. 474 pages. 9.25x6.10x1.30 inches. In Stock.
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Condition: new. Questo è un articolo print on demand.
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Extended Defects in Germanium
Language: English
Published by Springer Berlin Heidelberg, 2010
ISBN 10: 3642099211 ISBN 13: 9783642099212
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Deals with all aspects of defects in Ge, an element which is gaining importance again in semiconductor technologyDiscusses all kinds of expanded defects in Ge, such as dislocation, stacking faults, twins, grain boundaries and bubbles on a crystall.
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Fundamental and Technological Aspects of Extended Defects in Germanium
Language: English
Published by Springer Berlin Heidelberg, 2009
ISBN 10: 3540856110 ISBN 13: 9783540856115
US$ 165.39
US$ 57.78 shipping
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Deals with all aspects of defects in Ge, an element which is gaining importance again in semiconductor technologyDiscusses all kinds of expanded defects in Ge, such as dislocation, stacking faults, twins, grain boundaries and bubbles on a crystall.
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Germanium-Based Technologies
Language: English
Published by Elsevier Science Mai 2007, 2007
ISBN 10: 0080449530 ISBN 13: 9780080449531
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Germanium is a semiconductor material that formed the basis for the development of transistor technology. Although the breakthrough of planar technology and integrated circuits put silicon in the foreground, in recent years there has been a renewed interest in germanium, which has been triggered by its strong potential for deep submicron (sub 45 nm) technologies. Germanium-Based technologies: From Materials to Devices is the first book to provide a broad, in-depth coverage of the field, including recent advances in Ge-technology and the fundamentals in material science, device physics and semiconductor processing. The contributing authors are international experts with a world-wide recognition and involved in the leading research in the field. The book also covers applications and the use of Ge for optoelectronics, detectors and solar cells. An ideal reference work for students and scientists working in the field of physics of semiconductor devices and materials, as well as for engineers in research centres and industry. Both the newcomer and the expert should benefit from this unique book. 480 pp. Englisch.
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Metal Impurities in Silicon and Germanium-Based Technologies
Book 185 of 233: Springer Series in Materials ScienceLanguage: English
Published by Springer International Publishing, 2018
ISBN 10: 3319939246 ISBN 13: 9783319939247
US$ 186.74
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Offers an essential survey of controlling defects in semiconductor devices Discusses different metals and important processing technologies in semiconductor devices   Discusses the in.
