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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected Topics in Electronics and Systems)
Language: English
Published by World Scientific Publishing Company, 2002
ISBN 10: 9810248423 ISBN 13: 9789810248420
Hardcover. Condition: Fine. Dust Jacket Condition: Very Good. Hardcover. Book Condition: Fine. Jacket Condition: Very Good. World Scientific Publishing Company, 2002. 280 pages. Nice Firm Clean copy ! Jacket has 1 short tear. Size: 10 x 6.7 x 0.7. Engineering Science/Nature::Chemistry 6039L.
