Dutt Nikil (103 results)

hardcover. Condition: Very Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or limited writing/highlighting. We ship orders daily and Customer Service is our top priority.

hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Condition: New. pp. 202.

Condition: New. pp. 202 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Condition: New.

Condition: New. pp. 202.

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Hardcover. Condition: Very Good. Includes CD. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Creasing to top corner of last 70 pages from improper storage. Inside pages are clean. ; 6.24 X 0.8 X 9.58 inches; 256 pages.

hardcover. Condition: Hardcover. Hardcover. New, unused. gift inscribedclear text,For any additional information or pictures, please inquire.

Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condition: New. In English.

Condition: As New. Unread book in perfect condition.

Condition: New.

Condition: New.

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.…

Condition: New. In English.

hardcover. Condition: Wie neu. 544 Seiten; 9780123738929.1 Gewicht in Gramm: 2.

Hardcover. Condition: Brand New. 621 pages. 9.25x6.10x1.61 inches. In Stock.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Hardcover. Condition: Brand New. illustrated edition. 536 pages. 9.50x8.00x1.50 inches. In Stock.

Condition: As New. Unread book in perfect condition.

Condition: New.

Condition: New.

Paperback. Condition: New.

Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Validation of programmable architectures, consisting of processor cores, coprocessors, and memory subsystems, is one of the major bottlenecks in current System-on-Chip design methodology. A critical challenge in validation of such systems is the lack of a golden reference model. As a result, many existing validation techniques employ a bottom-up approach to design verification, where the functionality of an existing architecture is, in essence, reverse-engineered from its implementation. Traditional validation techniques employ different reference models depending on the abstraction level and verification task, resulting in potential inconsistencies between multiple reference models.This book presents a top-down validation methodology that complements the existing bottom-up approaches. It leverages the system architect's knowledge about the behavior of the design through architecture specification using an Architecture Description Language (ADL). The authors also address two fundamental challenges in functional verification: lack of a golden reference model, and lack of a comprehensive functional coverage metric. Functional Verification of Programmable Embedded Architectures: A Top-Down Approach is designed for students, researchers, CAD tool developers, designers, and managers interested in the development of tools, techniques and methodologies for system-level design, microprocessor validation, design space exploration and functional verification of embedded systems.…

Condition: New. In English.