Edited John Scott Dave Bartram (1 results)
Author:
Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing
Edited by John C. Scott , Dave Bartram , Douglas H. Reynolds
Language: English
Published by Cambridge University Press, 2020
Series: Educational and Psychological Testing in a Global Context, Book 2 of 6. Book 2 of 6 - Educational and Psychological Testing in a Global Context
- Softcover
- Print on Demand
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 60.93
US$ 16.72 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 421 pages. 9.06x6.10x0.87 inches. In Stock. This item is printed on demand.
