Graydon Larrabee (13 results)

Hardcover. Condition: UsedGood. Hardcover; Texas Instruments Electronics Series; surplus library copy with the usual stampings; reference number affixed to spine; fading and shelf we ar to exterior; otherwise in good condition with clean text and tight bindi ng.

Hard Cover. Condition: Very Good. First Edition. a very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ---------- SATISFACTION GUARANTEED --------- FAST, COURTEOUS SERVICE ------ ALL ORDERS SHIPPED WITH DELIVERY CONFIRMATION; Size: 7 x 10". Ex-Library.

Hardcover. Condition: UsedGood. Hardcover; surplus library copy with the usual stampings; reference number taped to spine; light fading, shelf wear to exterior; tape marks on front c over; bump to bottom corners; otherwise in good condition with clean text, firm binding.

Hardcover. Condition: Fine. 1st Edition. No Markings.

Condition: Gebraucht / Used. third printing. 1978. Hardcover. xviii,670pp.

Paperback. Condition: Brand New. 614 pages. 9.25x6.00x1.39 inches. In Stock.

Condition: New. In English.

Condition: New. pp. 692.

Hardcover. Condition: Good. No Dust Jacket. First Edition; Second Printing. 598 pages; Ex-Library copy with usual identifiers. Charts. Graphs. Crack on title page gutter, as well as the rear inner hinge. Book is structurally sound nonetheless. Minor shelf rubbing on the covers and spine. Good condition otherwise. No other noteworthy defects. No markings on text pages.; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence.…

Condition: New. Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling pro.

Taschenbuch. Condition: Neu. Neuware - Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, 'Materials Character ization,' to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.…

Condition: New. Print on Demand pp. 692 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.

Condition: New. PRINT ON DEMAND pp. 692.