Lefevree Bruce (4 results)
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 79.29
US$ 2.64 shippingShips within U.S.A.Quantity: 1 available
Condition: New.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 82.72
US$ 2.64 shippingShips within U.S.A.Quantity: 1 available
Condition: As New. Unread book in perfect condition.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 80.46
US$ 20.09 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: New.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 87.32
US$ 20.09 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: As New. Unread book in perfect condition.
