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Published by John Wiley & Sons Inc, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Published by John Wiley & Sons Inc, 2013
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Add to basketCondition: New. This book provides analytical and industrial chemists with up-to-date coverage of the advances in measurement technology in gas analysis. Editor(s): Raynor, Mark W.; Geiger, William M. Num Pages: 386 pages, illustrations. BIC Classification: PNF. Category: (P) Professional & Vocational. Dimension: 239 x 156 x 28. Weight in Grams: 706. . 2013. Hardback. . . . .
Language: English
Published by John Wiley & Sons Inc, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Add to basketHardcover. Condition: Brand New. 1st edition. 386 pages. 9.30x6.30x1.10 inches. In Stock.
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Add to basketGebunden. Condition: New. WILLIAM M. GEIGER, B.S., is Senior Partner of CONSCI, LTD, an independent service provider. He is responsible for implementation of analytical technology as it relates to gas analysis, including method development, turn-key instrumentation for customers, an.
Language: English
Published by John Wiley & Sons Inc, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Condition: New. This book provides analytical and industrial chemists with up-to-date coverage of the advances in measurement technology in gas analysis. Editor(s): Raynor, Mark W.; Geiger, William M. Num Pages: 386 pages, illustrations. BIC Classification: PNF. Category: (P) Professional & Vocational. Dimension: 239 x 156 x 28. Weight in Grams: 706. . 2013. Hardback. . . . . Books ship from the US and Ireland.
Buch. Condition: Neu. Neuware - Explores the latest advances and applications of specialty and electronic gas analysisThe semiconductor industry depends upon a broad range of instrumental techniques in order to detect and analyze impurities that may be present in specialty and electronic gases, including permanent gases, water vapor, reaction by-products, and metal species. Trace Analysis of Specialty and Electronic Gases draws together all the latest advances in analytical chemistry, providing researchers with both the theory and the operating principles of the full spectrum of instrumental techniques available for specialty and electronic gas analysis. Moreover, the book details the advantages and disadvantages of each technique, steering readers away from common pitfalls.Featuring contributions from leading analytical and industrial chemists, Trace Analysis of Specialty and Electronic Gases covers a wide range of practical industrial applications. The book begins with the historical development of gas analysis and then focuses on particular subjects or techniques such as:\* Metals sampling and ICP-MS analysis\* Improvements in FTIR spectroscopy\* Water vapor analysis techniques\* New infrared laser absorption spectroscopy approaches\* GC/MS, GC/AED, and GC-ICP-MS techniques\* Gas chromatography columns\* Atmospheric pressure ionization mass spectrometryLastly, the book examines gas mixtures and standards that are critical for instrument calibration. There are also two appendices offering information on fittings and material compatibility.With its thorough review of the literature and step-by-step guidance, Trace Analysis of Specialty and Electronic Gases enables researchers to take full advantage of the latest advances in gas analysis. Although the book's focus is the semiconductor and electronics industry, analytical chemists in other industries facing challenges with such issues as detection selectivity and sensitivity, matrix gas interference, and materials compatibility will also discover plenty of useful analytical approaches and techniques.
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Condition: very_good. Fast Free Shipping â" Very Good condition book with a firm cover and clean pages. Shows normal use and some light wear or limited notes markings. A solid, nice copy to enjoy.
Language: English
Published by John Wiley & Sons Inc, New York, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Hardcover. Condition: new. Hardcover. Explores the latest advances and applications of specialty and electronic gas analysis The semiconductor industry depends upon a broad range of instrumental techniques in order to detect and analyze impurities that may be present in specialty and electronic gases, including permanent gases, water vapor, reaction by-products, and metal species. Trace Analysis of Specialty and Electronic Gases draws together all the latest advances in analytical chemistry, providing researchers with both the theory and the operating principles of the full spectrum of instrumental techniques available for specialty and electronic gas analysis. Moreover, the book details the advantages and disadvantages of each technique, steering readers away from common pitfalls. Featuring contributions from leading analytical and industrial chemists, Trace Analysis of Specialty and Electronic Gases covers a wide range of practical industrial applications. The book begins with the historical development of gas analysis and then focuses on particular subjects or techniques such as: Metals sampling and ICP-MS analysisImprovements in FTIR spectroscopyWater vapor analysis techniquesNew infrared laser absorption spectroscopy approachesGC/MS, GC/AED, and GC-ICP-MS techniquesGas chromatography columnsAtmospheric pressure ionization mass spectrometry Lastly, the book examines gas mixtures and standards that are critical for instrument calibration. There are also two appendices offering information on fittings and material compatibility. With its thorough review of the literature and step-by-step guidance, Trace Analysis of Specialty and Electronic Gases enables researchers to take full advantage of the latest advances in gas analysis. Although the book's focus is the semiconductor and electronics industry, analytical chemists in other industries facing challenges with such issues as detection selectivity and sensitivity, matrix gas interference, and materials compatibility will also discover plenty of useful analytical approaches and techniques. This book provides analytical and industrial chemists with up-to-date coverage of the advances in measurement technology in gas analysis. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Language: English
Published by John Wiley & Sons Inc, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Add to basketHardcover. Condition: Brand New. 1st edition. 386 pages. 9.30x6.30x1.10 inches. In Stock. This item is printed on demand.
Language: English
Published by John Wiley & Sons Inc, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 708.
Language: English
Published by John Wiley & Sons Inc, New York, 2013
ISBN 10: 1118065662 ISBN 13: 9781118065662
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Add to basketHardcover. Condition: new. Hardcover. Explores the latest advances and applications of specialty and electronic gas analysis The semiconductor industry depends upon a broad range of instrumental techniques in order to detect and analyze impurities that may be present in specialty and electronic gases, including permanent gases, water vapor, reaction by-products, and metal species. Trace Analysis of Specialty and Electronic Gases draws together all the latest advances in analytical chemistry, providing researchers with both the theory and the operating principles of the full spectrum of instrumental techniques available for specialty and electronic gas analysis. Moreover, the book details the advantages and disadvantages of each technique, steering readers away from common pitfalls. Featuring contributions from leading analytical and industrial chemists, Trace Analysis of Specialty and Electronic Gases covers a wide range of practical industrial applications. The book begins with the historical development of gas analysis and then focuses on particular subjects or techniques such as: Metals sampling and ICP-MS analysisImprovements in FTIR spectroscopyWater vapor analysis techniquesNew infrared laser absorption spectroscopy approachesGC/MS, GC/AED, and GC-ICP-MS techniquesGas chromatography columnsAtmospheric pressure ionization mass spectrometry Lastly, the book examines gas mixtures and standards that are critical for instrument calibration. There are also two appendices offering information on fittings and material compatibility. With its thorough review of the literature and step-by-step guidance, Trace Analysis of Specialty and Electronic Gases enables researchers to take full advantage of the latest advances in gas analysis. Although the book's focus is the semiconductor and electronics industry, analytical chemists in other industries facing challenges with such issues as detection selectivity and sensitivity, matrix gas interference, and materials compatibility will also discover plenty of useful analytical approaches and techniques. This book provides analytical and industrial chemists with up-to-date coverage of the advances in measurement technology in gas analysis. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.