Seongil (38 results)

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Paperback. Condition: new. Paperback. Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational. Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Welcome to the proceedings of APCHI 2008, the 8th Asia-Pacific Conference on Computer-Human Interaction held in Seoul, Korea. Following the success of the preceding APCHI conferences, in Singapore (1996, 2000), Australia (1997), Japan (1998), China (2002), New Zealand (2004) and Taiwan (2006), the 8th APCHI brought together the researchers, developers, practitioners, and educators in the field of human-computer interaction. APCHI has been a major forum for scholars and practitioners in the Asia-Pacific region on the latest challenges and developments in HCI. Theoretical breakthroughs and practical systems and interfaces were presented at this 2008 conference, thanks to the support of KADO, the HCI ITRC of Sungkyu- wan University, and KIST. APCHI 2008 featured a comprehensive program including keynote speeches, regular paper presentations, poster, demos, and special panel sessions. To address the challenge of socially blending ubiquitous computing technologies and a wider sp- trum of people with a variety of skills, knowledge, and capabilities, APCHI 2008 set 'Universal and Ubiquitous' as the conference theme. APCHI 2008 attracted a total of 151 paper submissions. Among such a large number of submissions, 45 full papers were accepted as submitted or with minor revisions. All papers were reviewed by at least two reviewers. For the remaining submissions, 41 were recommended to change according to the reviews and were submitted as extended abstracts and posters. One special session with six invited papers was organized to support the conference theme of 'Universal and Ubiquitous.

Taschenbuch. Condition: Neu. Photo-Excited Charge Collection Spectroscopy | Probing the traps in field-effect transistors | Seongil Im (u. a.) | Taschenbuch | xi | Englisch | 2013 | Springer | EAN 9789400763913 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Condition: Neu. Computer-Human Interaction | 8th Asia-Pacific Conference, APCHI 2008 Seoul, Korea, July 6-9, 2008, Proceedings | Seongil Lee (u. a.) | Taschenbuch | xv | Englisch | 2008 | Springer | EAN 9783540705840 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Condition: Neu. Kinematics and Robust Control for Mechanical Systems | Application Studies of Control and Dynamical Systems | Seongil Hong | Taschenbuch | 132 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783845423524 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.

Paperback. Condition: new. Paperback. Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational. Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

Condition: Sehr gut. Zustand: Sehr gut | Seiten: 480 | Sprache: Englisch | Produktart: Bücher | Welcome to the proceedings of APCHI 2008, the 8th Asia-Pacific Conference on ComputerżHuman Interaction held in Seoul, Korea. Following the success of the preceding APCHI conferences, in Singapore (1996, 2000), Australia (1997), Japan (1998), China (2002), New Zealand (2004) and Taiwan (2006), the 8th APCHI brought together the researchers, developers, practitioners, and educators in the field of humanżcomputer interaction. APCHI has been a major forum for scholars and practitioners in the Asia-Pacific region on the latest challenges and developments in HCI. Theoretical breakthroughs and practical systems and interfaces were presented at this 2008 conference, thanks to the support of KADO, the HCI ITRC of Sungkyu- wan University, and KIST. APCHI 2008 featured a comprehensive program including keynote speeches, regular paper presentations, poster, demos, and special panel sessions. To address the challenge of socially blending ubiquitous computing technologies and a wider sp- trum of people with a variety of skills, knowledge, and capabilities, APCHI 2008 set żUniversal and Ubiquitousż as the conference theme. APCHI 2008 attracted a total of 151 paper submissions. Among such a large number of submissions, 45 full papers were accepted as submitted or with minor revisions. All papers were reviewed by at least two reviewers. For the remaining submissions, 41 were recommended to change according to the reviews and were submitted as extended abstracts and posters. One special session with six invited papers was organized to support the conference theme of żUniversal and Ubiquitous.

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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.

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Paperback. Condition: Brand New. 2013 edition. 101 pages. 9.00x6.25x0.25 inches. In Stock. This item is printed on demand.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational. 116 pp. Englisch.

Condition: New. Print on Demand pp. 116 61 Illus.