Thijs Steven (7 results)

Condition: Very Good.

Paperback. Condition: Good. 1993 Snoeck-Ducaji & Zoon large format paperback edition. Some reading wear else good condition. Contents: Prologue by Jan van der Stock The Flowering, Decline and Revival of a Metropolis by H.B. Cools Antwerp, the Metropolis and its History by Leon Voet Antwerp as a World Market in the Sixteenth and Seventeenth Centuries by Herman van der Wee and Jan Materne Antwerp and the Sea by Gustaaf Asaert Social Relations in Antwerp in the Sixteenth and Seventeenth Centuries by Hugo Soly Antwerp, a Metropolis in Europe by Peter Burke Antwerp under the Magnifying Glass. An Anthology by Anne-Marie van Passen Antwerp Portrayed by Jan Grieten and Paul Huvenne Antwerp Described by Herman Pleij A Printing Capital in its Ascendancy, Flowering and Decline by Francine de Nave Humanism and Humanists by Marcus de Schepper Antwerp's Luxury Industries: the Pursuit of Profit and Artistic Sensitivity by Alfons K.L. Thijs Antwerp, Foster-mother of the Arts: its Contribution to the Artistic Culture in Europe in the Seventeenth Century by Arnout Balis The Metropolis Reviewed. The Creation of a Golden Age by Lut Pil Epilogue: Story of an Exhibition by Steven Jacobs Catalogue Part 1: The Metropolitan Idea: Fiction and Facts Part 2: Antwerp - Metropolis? Authors of the Catalogue Abbreviations.…

Taschenbuch. Condition: Neu. ESD Protection Challenges | FinFET Technology and RF CMOS Circuits | Steven Thijs (u. a.) | Taschenbuch | 272 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783838336428 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.…

Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF) applications to operate at higher RF frequencies and wider bandwidths, adequate ESD protection needs to be developed without compromising RF performance. This book, therefore, provides an in-depth analysis on ESD protection structures and concepts, implemented in silicon on insulator FinFET technology. Complex dependencies are found for the different ESD performance parameters on both device geometry and process technology. Further, in this book, novel RF-ESD protection solutions are proposed for both narrow- and wideband RF CMOS circuits in most advanced CMOS technologies, with a special emphasis towards CDM protection. This analysis should provide fundamental understanding of the ESD challenges for FinFET technology and RF CMOS circuits, and should be especially useful to everyone working with ESD in the field of product development, support, research or education. 272 pp. Englisch.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Thijs StevenSteven Thijs, PhD: Studied Civil Electrotechnical Engineering at Katholieke Universiteit Leuven. Senior Researcher at imec, Leuven, Belgium. Guido Groeseneken, PhD: Fellow at imec, Leuven, Belgium. Also professor at Kat. …

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF) applications to operate at higher RF frequencies and wider bandwidths, adequate ESD protection needs to be developed without compromising RF performance. This book, therefore, provides an in-depth analysis on ESD protection structures and concepts, implemented in silicon on insulator FinFET technology. Complex dependencies are found for the different ESD performance parameters on both device geometry and process technology. Further, in this book, novel RF-ESD protection solutions are proposed for both narrow- and wideband RF CMOS circuits in most advanced CMOS technologies, with a special emphasis towards CDM protection. This analysis should provide fundamental understanding of the ESD challenges for FinFET technology and RF CMOS circuits, and should be especially useful to everyone working with ESD in the field of product development, support, research or education.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 272 pp. Englisch.…