Thijs Steven (5 results)

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    • Language: English

      Published by LAP LAMBERT Academic Publishing, 2010

      3838336429 / 9783838336428

      • Softcover

      Seller: preigu, Osnabrück, Germanypreigu

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      Taschenbuch. Condition: Neu. ESD Protection Challenges | FinFET Technology and RF CMOS Circuits | Steven Thijs (u. a.) | Taschenbuch | 272 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783838336428 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de |

    • Language: English

      Published by LAP Lambert Academic Publishing, 2010

      3838336429 / 9783838336428

      • Softcover

      Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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      Condition: Used - As new

      US$ 200.75

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      Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Language: English

      Published by LAP LAMBERT Academic Publishing Feb 2010, 2010

      3838336429 / 9783838336428

      • Softcover
      • Print on Demand

      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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      Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF)

    • Language: English

      Published by LAP LAMBERT Academic Publishing, 2010

      3838336429 / 9783838336428

      • Softcover
      • Print on Demand

      Seller: moluna, Greven, Germanymoluna

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      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Thijs StevenSteven Thijs, PhD: Studied Civil Electrotechnical Engineering at Katholieke Universiteit Leuven. Senior Researcher at imec, Leuven, Belgium. Guido Groeseneken, PhD: Fellow at imec, Leuven, B

    • Language: English

      Published by LAP LAMBERT Academic Publishing Feb 2010, 2010

      3838336429 / 9783838336428

      • Softcover
      • Print on Demand

      Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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      Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Two main Electro Static Discharge (ESD) challenges lie ahead. Firstly, FinFET technology has only a limited available silicon volume to dissipate the ESD current. Secondly, as CMOS technology downscaling allows Radio Frequency (RF) appl