Ubar (49 results)

Hardcover. Condition: Very Good. Later Printing; First Printing. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

fair. fair.

Softcover. Condition: Très bon. Ancien livre de bibliothèque avec équipements. Tome 1. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Volume 1. Ammareal gives back up to 15% of this item's net price to charity organizations.…

kart.. 1. 1. Aufl., gr. 8°, S.: 216, Ill., kart., Ecken und Ränder bestoßen und fleckig, Seiten angegilbt und fleckig sonst gut erhalten, Sprache: Deutsch 0,340 gr.

Condition: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

215 S., 8°, Obrosch, 1. Auflg., mit 96 Bildern und 17 Tafeln, ehemaliges Bibliotheksexemplar, Stempel au Vs., Vorwort von den Herausgebern, sehr gut.

Paperback. Condition: Brand New. 180 pages. 8.66x5.91x0.41 inches. In Stock.

Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New.

Condition: New. In English.

Condition: New.

Condition: New.

Condition: New. 1st ed. 2024 edition NO-PA16APR2015-KAP.

Condition: New.

Hardcover. Condition: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Condition: New.

Hardback. Condition: New. Illustrated.

Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Hardcover. Condition: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.

Taschenbuch. Condition: Neu. Structural Decision Diagrams in Digital Test | Theory and Applications | Raimund Ubar (u. a.) | Taschenbuch | Computer Science Foundations and Applied Logic | xiii | Englisch | 2025 | Springer | EAN 9783031447365 | Verantwortliche Person für die EU: Springer Basel AG in Springer Science + Business Media, Heidelberger Platz 3, 14197 Berlin, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level,structurally synthesized binary DDs (SSBDDs)andhigh-level DDs (HLDDs)that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computerscience and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia:Raimund Ubaris a retired Professor,Jaan RaikandMaksim Jenihhinare tenured Professors.Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.…

Hardback. Condition: New. Illustrated.

Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Hardcover. Condition: Brand New. 608 pages. 9.25x6.10x1.26 inches. In Stock.

Hardcover. Condition: new. Hardcover. This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.Topics and features:Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDsProvides numerous working examples that illustrate the key points of the textDescribes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generationDiscusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representationsCombines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasksThis unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

Condition: As New. Unread book in perfect condition.

Condition: As New. Unread book in perfect condition.

Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for modeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. 180 pp. Englisch.…