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Zhong Guo Ren Min Jie Fang Jun Zong Zhuang Bei Bu Jun Shi Xun Lian Jiao Cai Bian Ji Gong Zuo Wei Yuan Hui (1 results)
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structural analysis and identification of emission testing technology(Chinese Edition)
Published by Defense Industry Press, 2000
ISBN 10: 7118041602 ISBN 13: 9787118041606
Language: English
US$ 68.97
Convert currencyUS$ 18.00 shipping from China to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: New. Language:Chinese.Hardcover. Publisher: Defense Industry Press. This book comprehensively and systematically expounded the missile launch tests. using measured data range guide.
