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Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: HPB-Red, Dallas, TX, U.S.A.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Campus Bookstore, Denton, TX, U.S.A.
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Hardcover. Condition: Good. 2ND 2ND May contain highlighting/underlining/notes/etc. May have used stickers on cover. Access codes and supplements are not guaranteed to be included with used books. Ships same or next day. Expedited shipping: 3-5 business days, Standard shipping: 4-14 business days.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: GreatBookPrices, Columbia, MD, U.S.A.
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Condition: New.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Books Puddle, New York, NY, U.S.A.
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Condition: New. pp. 428 2nd Edition.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Majestic Books, Hounslow, United Kingdom
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Condition: New. pp. 428 241 Illus.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: GreatBookPrices, Columbia, MD, U.S.A.
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Condition: As New. Unread book in perfect condition.
Published by Springer-Verlag New York Inc., 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
Published by Springer 2004-09-29, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Chiron Media, Wallingford, United Kingdom
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Hardcover. Condition: New.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
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Condition: New.
Published by Springer-Verlag GmbH, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Buchpark, Trebbin, Germany
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Condition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. 2. Auflage. Innen: Seiten eingerissen. | Seiten: 408 | Sprache: Englisch.
Published by Springer-Verlag New York Inc., 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Book
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
Published by Springer-Verlag New York Inc., 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
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Hardback. Condition: New. New copy - Usually dispatched within 4 working days.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: booksXpress, Bayonne, NJ, U.S.A.
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Hardcover. Condition: new.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: BennettBooksLtd, North Las Vegas, NV, U.S.A.
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Condition: New. New. In shrink wrap. Looks like an interesting title! 1.68.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
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Condition: New.
Published by Springer New York 2004-08-27, New York |London, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Blackwell's, London, United Kingdom
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hardback. Condition: New. Language: ENG.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Book Print on Demand
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Revaluation Books, Exeter, United Kingdom
Book Print on Demand
Hardcover. Condition: Brand New. 2nd edition. 408 pages. 9.25x6.25x1.00 inches. In Stock. This item is printed on demand.
Published by Springer-Verlag Gmbh Aug 2004, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Rheinberg-Buch Andreas Meier eK, Bergisch Gladbach, Germany
Book
Buch. Condition: Neu. Neuware -During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch.
Published by Springer-Verlag Gmbh Aug 2004, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Book
Buch. Condition: Neu. Neuware -During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch.
Published by Springer-Verlag Gmbh Aug 2004, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Wegmann1855, Zwiesel, Germany
Book
Buch. Condition: Neu. Neuware -During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Published by Springer-Verlag Gmbh Aug 2004, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: AHA-BUCH GmbH, Einbeck, Germany
Book
Buch. Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: California Books, Miami, FL, U.S.A.
Book
Condition: New.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Book Print on Demand
Hardcover. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
Book
Condition: As New. Unread book in perfect condition.
Published by Springer, 2004
ISBN 10: 0387400923ISBN 13: 9780387400921
Seller: Mispah books, Redhill, SURRE, United Kingdom
Book
Hardcover. Condition: Like New. Like New. book.