9780387400938 - Transmission Electron Microscopy: Physics of Image Formation (springer Series in Optical Sciences, 36) by Reimer, Ludwig; Kohl, Helmut (11 results)
Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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hardcover. Condition: Befriedigend. 606 Seiten; 9780387400938.4 Gewicht in Gramm: 2.
Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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hardcover. Condition: Fine.
Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Language: English
Published by Springer, 2008
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- Hardcover
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Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Published by Springer-Verlag New York Inc., US, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Hardback. Condition: New. Fifth Edition 2008. Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the t…heory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM.
Language: English
Published by Springer-Verlag New York Inc., US, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Hardback. Condition: New. Fifth Edition 2008. Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the t…heory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM.
Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Condition: New. pp. 608 5th Edition.
Language: English
Published by Springer, 2008
Series: Springer Series in Optical Sciences, Book 41 of 235. Book 41 of 235 - Springer Series in Optical Sciences
- Hardcover
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Condition: New. pp. 608 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
