Isbn: 9781441923080 - Transmission Electron Microscopy: Physics of Image Formation (springer Series in Optical Sciences, 36) (9 results)

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  • Language: English

    Published by Springer, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

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  • Language: English

    Published by Springer, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

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  • Language: English

    Published by Springer, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

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  • Language: English

    Published by Springer, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

    • Softcover

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    Language: English

    Published by Springer New York, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

    • Softcover

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    Taschenbuch. Condition: Neu. Transmission Electron Microscopy | Physics of Image Formation | Ludwig Reimer (u. a.) | Taschenbuch | xvi | Englisch | 2010 | Springer New York | EAN 9781441923080 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

  • Language: English

    Published by Springer New York, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

    • Softcover

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.…

  • Language: English

    Published by Springer, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

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  • Language: English

    Published by Springer New York, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Standard reference bookNow updated by the successor of the original authorNew topics of the field includedGives a comprehensive review of recent progresses in TEMThe aim of this monograph is to outline the physics of image fo.…

  • Language: English

    Published by Springer Nature Singapore Nov 2010, 2010

    144192308X / 9781441923080

    Series: Book 41 of 235 - Springer Series in Optical Sciences

    • Softcover
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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics. 590 pp. Englisch.…