Isbn: 9783662443613 - X-ray Absorption Spectroscopy of Semiconductors (springer Series in Optical Sciences, 190) (9 results)

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  • Language: English

    Published by Heidelberg, Springer, 2015

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover

    Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm

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    Hardcover. Condition: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05847 9783662443613 Sprache: Englisch Gewicht in Gramm: 550.

  • Language: English

    Published by Springer, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Hardcover. Condition: Brand New. 2015 edition. 361 pages. 9.25x6.25x1.00 inches. In Stock.

  • Language: English

    Published by Springer, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.…

  • Language: English

    Published by Springer, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover

    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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    Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Language: English

    Published by Springer, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover
    • Print on Demand

    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Springer Berlin Heidelberg Nov 2014, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover
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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research. 380 pp. Englisch.…

  • Language: English

    Published by Springer Berlin Heidelberg, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover
    • Print on Demand

    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a complete survey of the current state of the art of X-ray absorption spectroscopy of semiconductorsProvides an overview of a wide range of semiconductor materialsDisplays comprehensive summaries to allow the reader to access the grow.…

  • Language: English

    Published by Springer, Springer Nov 2014, 2014

    3662443619 / 9783662443613

    Series: Book 175 of 235 - Springer Series in Optical Sciences

    • Hardcover
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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases.Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society.The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials.Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 380 pp. Englisch.…