9787516040607 - Rietveld Refinement of X-ray Polycrystalline Diffraction Data and an Introduction to Gsas Software(chinese Edition) by Zheng Zhen Huan Chen Yu Long (1 results)

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    • Language: English

      Published by China Building Materials Industry Press, 2024

      7516040606 / 9787516040607

      • Softcover

      Seller: liu xing, Nanjing, JS, Chinaliu xing

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      Condition: New

      US$ 78.48

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      paperback. Condition: New. Language:Chinese.Paperback. Pub Date: 2024-03 Publisher: China Building Materials Industry Press The full spectrum fitting of the Rietveld method has become an important method for X-ray polycrystalline diffraction to correct crystal structure. This book consists of four chapters. focusing on introduci