Accelerating Test Validation Debug by Fan Yongquan (16 results)

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  • Language: English

    Published by Springer, 2010

    9048193974 / 9789048193974

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  • Language: English

    Published by Springer, 2014

    9400789734 / 9789400789739

    • Softcover

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    Condition: New. pp. 208.

  • Language: English

    Published by Springer, 2010

    9048193974 / 9789048193974

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  • Language: English

    Published by Springer, Springer, 2014

    9400789734 / 9789400789739

    • Softcover

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.…

  • Language: English

    Published by Springer, 2014

    9400789734 / 9789400789739

    • Softcover

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    Taschenbuch. Condition: Neu. Accelerating Test, Validation and Debug of High Speed Serial Interfaces | Yongquan Fan (u. a.) | Taschenbuch | xii | Englisch | 2014 | Springer | EAN 9789400789739 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

  • Language: English

    Published by Springer, 2014

    9400789734 / 9789400789739

    • Softcover

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    Paperback. Condition: Brand New. 2011 edition. 208 pages. 9.25x6.10x0.23 inches. In Stock.

  • Language: English

    Published by Springer, 2010

    9048193974 / 9789048193974

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  • Language: English

    Published by Springer, 2014

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  • Language: English

    Published by Springer Okt 2010, 2010

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions. 194 pp. Englisch.…

  • Language: English

    Published by Springer Netherlands, 2014

    9400789734 / 9789400789739

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Detailed instructions on achieving practical test of modern high-speed interfacesSelf-contained, with the background and tutorial includedExplains statistical measures of confidence and the ways to arrive at themYongquan Fan.…

  • Language: English

    Published by Springer Netherlands, 2010

    9048193974 / 9789048193974

    • Hardcover
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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Detailed instructions on achieving practical test of modern high-speed interfacesSelf-contained, with the background and tutorial includedExplains statistical measures of confidence and the ways to arrive at themYongquan Fan.…

  • Language: English

    Published by Springer, 2014

    9400789734 / 9789400789739

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    Condition: New. Print on Demand pp. 208.

  • Language: English

    Published by Springer, Springer Okt 2014, 2014

    9400789734 / 9789400789739

    • Softcover
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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch.…

  • Language: English

    Published by Springer, 2010

    9048193974 / 9789048193974

    • Hardcover
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    Condition: New. Print on Demand pp. 208 Illus.

  • Language: English

    Published by Springer, 2014

    9400789734 / 9789400789739

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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. 208.

  • Language: English

    Published by Springer, 2010

    9048193974 / 9789048193974

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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. 208.