Advanced Computing Electron Microscopy by Kirkland Earl (37 results)

- Hardcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Condition: New. pp. ix + 250 Index.
More images- Hardcover
Seller: Salish Sea Books, Bellingham, WA, U.S.A.Salish Sea Books
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US$ 124.95
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Condition: Like New. 2. Fine/As New; Hardcover; 2nd Edition; This book is brand new and still sealed in the publisher's original shrinkwrap; Perfect, new condition; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 1.8 lbs; Dark orange covers with title in white lettering; 2010, Springer-Verlag Publishing; 289 pages; "Advanced Computing in Electron Microscopy," by Earl J. Kirkland.…

- Hardcover
Seller: Books From California, Simi Valley, CA, U.S.A.Books From California
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US$ 126.84
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hardcover. Condition: Very Good.

- Hardcover
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

- Hardcover
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- Hardcover
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- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: As New. Unread book in perfect condition.

- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 191.24
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Condition: New. In English.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In English.

- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Hardcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
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Hardback. Condition: New. Third Edition 2020. This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.…

- Softcover
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- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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- Softcover
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Condition: As New. Unread book in perfect condition.

- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | xii | Englisch | 2021 | Springer | EAN 9783030332624 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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US$ 237.58
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. …

- Softcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Condition: New.

- Hardcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Condition: New.

- Hardcover
Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
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US$ 217.04
US$ 85.86 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Hardback. Condition: New. Third Edition 2020. This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.…

- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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US$ 318.21
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Paperback. Condition: Brand New. 3rd edition. 368 pages. 9.25x6.10x0.79 inches. In Stock.

- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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US$ 320.53
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Hardcover. Condition: Brand New. 3rd edition. 354 pages. 9.25x6.00x1.00 inches. In Stock.

- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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US$ 326.54
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Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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US$ 326.54
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Hardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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US$ 123.26
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Condition: New. Print on Demand pp. ix + 250 Illus.

- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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US$ 127.27
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Condition: New. PRINT ON DEMAND pp. ix + 250.

- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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Condition: new. Questo è un articolo print on demand.

Language: English
Published by Springer International Publishing, Springer International Publishing Mär 2020, 2020
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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US$ 196.78
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.…

- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 176.70
US$ 54.67 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade.…

- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 176.70
US$ 54.67 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade.…

- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
US$ 209.08
US$ 25.67 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.…