Advanced Computing Electron Microscopy by Kirkland Earl (37 results)

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  • Language: English

    Published by Springer, 1998

    0306459361 / 9780306459368

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    Condition: New. pp. ix + 250 Index.

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    Language: English

    Published by Springer-Verlag Publishing, 2010

    1441965327 / 9781441965325

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    Seller: Salish Sea Books, Bellingham, WA, U.S.A.Salish Sea Books

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    Condition: Like New. 2. Fine/As New; Hardcover; 2nd Edition; This book is brand new and still sealed in the publisher's original shrinkwrap; Perfect, new condition; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 1.8 lbs; Dark orange covers with title in white lettering; 2010, Springer-Verlag Publishing; 289 pages; "Advanced Computing in Electron Microscopy," by Earl J. Kirkland.…

  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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    hardcover. Condition: Very Good.

  • Language: English

    Published by Springer, 2010

    1441965327 / 9781441965325

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    hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

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    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer Nature Switzerland AG, CH, 2020

    3030332594 / 9783030332594

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    Hardback. Condition: New. Third Edition 2020. This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.…

  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

    • Softcover

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  • Language: English

    Published by Springer, 2014

    1489995099 / 9781489995094

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    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

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  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

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    Taschenbuch. Condition: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | xii | Englisch | 2021 | Springer | EAN 9783030332624 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. …

  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

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  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer Nature Switzerland AG, CH, 2020

    3030332594 / 9783030332594

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    Hardback. Condition: New. Third Edition 2020. This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.…

  • Language: English

    Published by Springer Nature, 2021

    3030332624 / 9783030332624

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    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Paperback. Condition: Brand New. 3rd edition. 368 pages. 9.25x6.10x0.79 inches. In Stock.

  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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    Hardcover. Condition: Brand New. 3rd edition. 354 pages. 9.25x6.00x1.00 inches. In Stock.

  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

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    Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Language: English

    Published by Springer, 2020

    3030332594 / 9783030332594

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  • Language: English

    Published by Springer, 1998

    0306459361 / 9780306459368

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    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    Condition: New. Print on Demand pp. ix + 250 Illus.

  • Language: English

    Published by Springer, 1998

    0306459361 / 9780306459368

    • Hardcover
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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. ix + 250.

  • Language: English

    Published by Springer, 2021

    3030332624 / 9783030332624

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  • Language: English

    Published by Springer International Publishing, Springer International Publishing Mär 2020, 2020

    3030332594 / 9783030332594

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.…

  • Language: English

    Published by Springer International Publishing, 2021

    3030332624 / 9783030332624

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    Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation&nbspAddresses the latest developments in the field from the last decade.…

  • Language: English

    Published by Springer International Publishing, 2020

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation&nbspAddresses the latest developments in the field from the last decade.…

  • Language: English

    Published by Springer, Springer Mär 2021, 2021

    3030332624 / 9783030332624

    • Softcover
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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.…