Advanced Measurement Imaging Instruments (4 results)

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  • Language: English

    Published by Springer, 2026

    9819581451 / 9789819581450

    • Hardcover

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    US$ 345.08

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book includes original, peer-reviewed research papers from the 16th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2025) and the 3rd International Conference of Optical Imaging and Measurement (ICOIM 2025), held in Wuhan, China on May 25 28, 2025. The topics covered include but are not limited to: Measurement and characterization for atomic-level manufacturing, micro and nanometrology, quantum sensing and instruments, metrology and instruments for integrated circuits, in-process and inline metrology, optical metrology and inspection, surface metrology, material characterization, machine learning and signal processing, intelligent instrument for automation, sensors and actuators, uncertainty, traceability and calibration, optical imaging, optical technology, application and precision measurement, optical measurement, photoelectric device, optoelectronics and communication, biomedical optics, and optical material.The papers showcased here share the latest findings on optical metrology, optical imaging, nanometrology, intelligent systems, and process control, making the book a valuable asset for researchers, engineers, and university students alike.…

  • Language: English

    Published by Springer Verlag GmbH, 2026

    9819581451 / 9789819581450

    • Hardcover
    • Print on Demand

    Seller: moluna, Greven, Germanymoluna

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    US$ 257.44

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt.

  • Language: English

    Published by Springer Nature Singapore Jun 2026, 2026

    9819581451 / 9789819581450

    • Hardcover
    • Print on Demand

    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    US$ 307.46

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book includes original, peer-reviewed research papers from the 16th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2025) and the 3rd International Conference of Optical Imaging and Measurement (ICOIM 2025), held in Wuhan, China on May 25 28, 2025. The topics covered include but are not limited to: Measurement and characterization for atomic-level manufacturing, micro and nanometrology, quantum sensing and instruments, metrology and instruments for integrated circuits, in-process and inline metrology, optical metrology and inspection, surface metrology, material characterization, machine learning and signal processing, intelligent instrument for automation, sensors and actuators, uncertainty, traceability and calibration, optical imaging, optical technology, application and precision measurement, optical measurement, photoelectric device, optoelectronics and communication, biomedical optics, and optical material.The papers showcased here share the latest findings on optical metrology, optical imaging, nanometrology, intelligent systems, and process control, making the book a valuable asset for researchers, engineers, and university students alike. 433 pp. Englisch.…

  • Language: English

    Published by Springer Jun 2026, 2026

    9819581451 / 9789819581450

    • Hardcover
    • Print on Demand

    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    US$ 307.46

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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book includes original, peer-reviewed research papers from the 16th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2025) and the 3rd International Conference of Optical Imaging and Measurement (ICOIM 2025), held in Wuhan, China on May 2528, 2025. The topics covered include but are not limited to: Measurement and characterization for atomic-level manufacturing, micro and nanometrology, quantum sensing and instruments, metrology and instruments for integrated circuits, in-process and inline metrology, optical metrology and inspection, surface metrology, material characterization, machine learning and signal processing, intelligent instrument for automation, sensors and actuators, uncertainty, traceability and calibration, optical imaging, optical technology, application and precision measurement, optical measurement, photoelectric device, optoelectronics and communication, biomedical optics, and optical material.The papers showcased here share the latest findings on optical metrology, optical imaging, nanometrology, intelligent systems, and process control, making the book a valuable asset for researchers, engineers, and university students alike.Springer Nature Customer Service Center GmbH, Europaplatz 3,69115 Heidelberg, Germany, Heidelberg 452 pp. Englisch.…