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Atomic Force Microscopy Process by Bowen Richard (12 results)
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Atomic Force Microscopy in Process Engineering : An Introduction to AFM for Improved Processes and Products
Language: English
Published by Elsevier Science & Technology, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
Condition: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Language: English
Published by Butterworth-Heinemann 2009-07-03, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
US$ 160.12
US$ 20.85 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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US$ 175.36
US$ 8.75 shipping
Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 304 14:B&W 6 x 9 in or 229 x 152 mm Case Laminate on White w/Gloss Lam.
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Atomic Force Microscopy In Process Engineering: An Introduction To Afm For Improved Processes And Products
Language: English
Published by Elsevier Science & Technology, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
US$ 181.75
US$ 16.82 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 1st edition. 304 pages. 9.00x6.00x0.25 inches. In Stock.
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Condition: New. pp. 304.
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Condition: New. pp. 304.
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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Language: English
Published by Elsevier Science & Technology, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 200.85
US$ 22.38 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. New copy - Usually dispatched within 4 working days.
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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Language: English
Published by Butterworth-Heinemann, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
US$ 220.39
US$ 33.64 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Language: English
Published by Butterworth-Heinemann, 2013
ISBN 10: 0080974694 ISBN 13: 9780080974699
US$ 280.19
US$ 16.82 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Brand New. 304 pages. 9.00x6.00x0.69 inches. In Stock.
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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
Language: English
Published by Butterworth-Heinemann Ltd, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
Condition: new. Questo è un articolo print on demand.
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Atomic Force Microscopy in Process Engineering
Language: English
Published by Butterworth-Heinemann Jul 2009, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. Englisch.
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Atomic Force Microscopy in Process Engineering : An Introduction to AFM for Improved Processes and Products
Language: English
Published by Butterworth-Heinemann, 2009
ISBN 10: 1856175170 ISBN 13: 9781856175173
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
