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Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 0.85.
Published by Kluwer Academic Publishers, Dordrecht, 2001
ISBN 10: 0792392965 ISBN 13: 9780792392965
Language: English
Seller: Florida Mountain Book Co., Datil, NM, U.S.A.
Condition: Very Good+. Hardcover, [xvi], 225 pages. Very Good+ condition. Second printing. Size 9.5"x6.25". Chapter headings: 1 - PCB Testing; 2 - The Boundary-Scan Test Standard; 3 - Hardware Test Innovations; 4 - BST Design Languages; 5 - PCB Test Strategy Backgrounds; 6 - Management Aspects. Includes Appendix, Glossary, References, and Index. Book has light exterior handling/shelfwear, else Fine condition, clean and unmarked.
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Add to basketCondition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792392965.
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Add to basketCondition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792392965.
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Add to basketSoftcover. Condition: Bon. Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Edition 1993. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slight signs of wear on the cover. Edition 1993. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Add to basketCondition: Good. Ältere Ausgabe. Auflage: 1993.
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Add to basketCondition: Gut. Auflage: 1993. 244 Seiten ex Library Book aus einer wissenschafltichen Bibliothek Sprache: Englisch Gewicht in Gramm: 545 24,7 x 16,5 x 2,1 cm, Broschiert.
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Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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Add to basketCondition: New. 2012. Paperback. . . . . .
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.
Published by Springer US, Springer US, 1992
ISBN 10: 0792392965 ISBN 13: 9780792392965
Language: English
Seller: AHA-BUCH GmbH, Einbeck, Germany
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Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.
Condition: New. 2012. Paperback. . . . . . Books ship from the US and Ireland.