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Computer Assisted Microscopy Measurement Analysis (10 results)
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Computer-Assisted Microscopy: The Measurement and Analysis of Images
Seller: Bay State Book Company, North Smithfield, RI, U.S.A.
Seller rating 5 out of 5 stars
Condition: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
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Computer-Assisted Microscopy: The Measurement and Analysis of Images
Language: English
Published by Plenum Pub Corp, New York, New York, U.S.A., 1990
ISBN 10: 0306434105 ISBN 13: 9780306434105
Hardcover. Condition: As New. No Jacket. First Edition, 3rd Printing. Previous owner's name on the front flyleaf, otherwise a fine, as new, hardcover first edition, 3rd printing copy in slick red binding, no DJ. The author is from NCSU, next door to our little bookshop.
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Computer-Assisted Microscopy: The Measurement and Analysis of Images
Seller: Robinson Street Books, IOBA, Binghamton, NY, U.S.A.
Association Member: IOBA
Seller rating 4 out of 5 stars
Hardcover. Condition: As New. Prompt Shipment, shipped in Boxes, Tracking PROVIDED2nd printing. Fine. *.
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Computer-Assisted Microscopy: The Measurement and Analysis of Images
Language: English
Published by New York, New York, U.S.A.: Plenum Pub Corp, 1990
ISBN 10: 0306434105 ISBN 13: 9780306434105
Hardcover. Condition: Fine. hardback book in fine condition.
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Computer-assisted microscopy. The measurement and analysis of images.
Language: English
Published by NewYork, Plenum Press, 1992
Hardcover. 3. printing. 453 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. w05823 306434105 Sprache: Englisch Gewicht in Gramm: 1100.
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Computer Assisted Microscopy: The Measurement and Analysis of Images
Language: English
Published by New York, New York, U.S.A.: Plenum Pub Corp, 1990
ISBN 10: 0306434105 ISBN 13: 9780306434105
Hardcover. Condition: Near Fine. Hardback in near fine condition.
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Computer-Assisted Microscopy: The Measurement and Analysis of Images
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.88
US$ 16.07 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Computer-Assisted Microscopy : Measurement and Analysis of Images
Language: English
Published by Kluwer Academic Publishers Group, 1990
ISBN 10: 0306434105 ISBN 13: 9780306434105
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 470 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Taschenbuch. Condition: Neu. Computer-Assisted Microscopy | The Measurement and Analysis of Images | John C. Russ | Taschenbuch | 470 S. | Englisch | 2011 | Humana | EAN 9781461278689 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.
