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Data Modeling Metrology Testing (12 results)
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US$ 79.77
Convert currencyUS$ 50.52 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. | Seiten: 512 | Sprache: Englisch | Produktart: Bücher.
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US$ 232.32
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US$ 230.98
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Data Modeling for Metrology and Testing in Measurement Science (Modeling and Simulation in Science, Engineering and Technology)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 232.37
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US$ 240.18
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Add to basketCondition: As New. Unread book in perfect condition.
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Data Modeling for Metrology and Testing in Measurement Science
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 232.36
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Data Modeling for Metrology and Testing in Measurement Science
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 247.37
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Data Modeling for Metrology and Testing in Measurement Science
Published by Birkhäuser Boston, Birkhäuser Boston, 2008
ISBN 10: 0817645926 ISBN 13: 9780817645922
Language: English
US$ 251.45
Convert currencyUS$ 36.63 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The aim of this book is to provide, rstly, an introduction to probability and statistics especially directed to the metrology and testing elds and secondly, a comprehensive, newer set of modelling methods for data and uncertainty analysis that are generally not considered yet within mainstream methods. The book brings, for the rst time, a coherent account of these newer me- ods and their computational implementation. They are potentially important because they address problems in application elds where the usual hypot- ses that are at the basis of most of the traditional statistical and probabilistic methods, for example, relating to normality of the probability distributions, are frequently not ful lled to such an extent that an accurate treatment of the calibration or test data using standard approaches is not possible. Additi- ally, the methods can represent alternative ways of data analysis, allowing a deeper understanding of complex situations in measurement. The book lends itself as a possible textbook for undergraduate or postgraduate study in an area where existing texts focus mainly on the most common and well-known methods that do not encompass modern approaches to calibration and testing problems. The book is structured in such a way to guide readers with only a g- eral interest in measurement issues through a series of review papers, from an initial introduction to modelling principles in metrology and testing, to the basic principles of probability in metrology and statistical approaches to - certainty assessment.
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US$ 352.33
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Add to basketHardcover. Condition: Brand New. hardback/dvd edition. 489 pages. 9.25x6.25x1.00 inches. In Stock.
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Data Modeling for Metrology and Testing in Measurement Science (Modeling and Simulation in Science, Engineering and Technology)
Seller: suspiratio - online bücherstube, Basel, Switzerland
Seller rating 5 out of 5 stars
US$ 75.16
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Add to basketHardcover. Condition: Sehr gut. sehr gu, mit cd, book is fine, probably not used, with CD (NURA-641.
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US$ 208.21
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Takes the reader beyond mainstream methods described in standard texts on data and uncertainty analysisReal-world applications in a variety of fields, including chemistry, software engineering, and metrologyFor a broad audience of graduate .
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Data Modeling for Metrology and Testing in Measurement Science
Published by Birkhäuser Boston Dez 2008, 2008
ISBN 10: 0817645926 ISBN 13: 9780817645922
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 247.44
Convert currencyUS$ 25.82 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketBuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The aim of this book is to provide, rstly, an introduction to probability and statistics especially directed to the metrology and testing elds and secondly, a comprehensive, newer set of modelling methods for data and uncertainty analysis that are generally not considered yet within mainstream methods. The book brings, for the rst time, a coherent account of these newer me- ods and their computational implementation. They are potentially important because they address problems in application elds where the usual hypot- ses that are at the basis of most of the traditional statistical and probabilistic methods, for example, relating to normality of the probability distributions, are frequently not ful lled to such an extent that an accurate treatment of the calibration or test data using standard approaches is not possible. Additi- ally, the methods can represent alternative ways of data analysis, allowing a deeper understanding of complex situations in measurement. The book lends itself as a possible textbook for undergraduate or postgraduate study in an area where existing texts focus mainly on the most common and well-known methods that do not encompass modern approaches to calibration and testing problems. The book is structured in such a way to guide readers with only a g- eral interest in measurement issues through a series of review papers, from an initial introduction to modelling principles in metrology and testing, to the basic principles of probability in metrology and statistical approaches to - certainty assessment. 512 pp. Englisch.
