Defect Microstructure Analysis Diffraction by Snyder Robert (9 results)
- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
Contact seller5-star sellerCondition: New
US$ 474.36
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Condition: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography - Monographs on Crystallography. Num Pages: 808 pages, numerous line figures. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 49. Weight in Grams: 1292. . 2000. Hardback. . . . .…
Language: English
Published by International Union of Crystallography, 2000
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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US$ 482.60
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Condition: New.
Language: English
Published by International Union of Crystallography, 2000
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 500.00
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Condition: As New. Unread book in perfect condition.
Language: English
Published by International Union of Crystallography, 2000
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 521.76
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Condition: New.
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contact seller5-star sellerCondition: New
US$ 562.53
US$ 10.50 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New. Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction. Editor(s): Snyder, Robert; Fiala, Jaroslav; Bunge, Hans J. Series: International Union of Crystallography - Monographs on Crystallography. Num Pages: 808 pages, numerous line figures. BIC Classification: PNT. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 49. Weight in Grams: 1292. . 2000. Hardback. . . . . Books ship from the US and Ireland.…
Language: English
Published by International Union of Crystallography, 2000
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 593.63
US$ 20.05 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by International Union of Crystallography, 2000
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 636.20
US$ 19.97 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In English.
Language: English
Published by International Union of Crystallography, 2000
- Hardcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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US$ 796.00
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Hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
US$ 858.66
US$ 11.41 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 808.
