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Defect Oriented Testing Nano Metric Cmos by Sachdev Manoj (18 results)
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Published by New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Language: English
US$ 32.17
Convert currencyFree shipping from Australia to U.S.A.Quantity: 1 available
Add to basketBrand new book. Fast ship. Please provide full street address as we are not able to ship toPOboxaddress.
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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US$ 40.60
Convert currencyUS$ 124.17 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: New. pp. 352 2nd Edition.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 188.29
Convert currencyUS$ 16.33 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 199.13
Convert currencyUS$ 8.86 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: New. pp. 352 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. SUPER FAST SHIPPING.
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Condition: New. SUPER FAST SHIPPING.
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US$ 230.23
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Add to basketCondition: New.
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US$ 230.69
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Add to basketCondition: New.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 268.44
Convert currencyUS$ 16.33 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 262.52
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Add to basketHardcover. Condition: Like New. Like New. book.
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US$ 348.60
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Add to basketPaperback. Condition: Brand New. 2nd edition. 349 pages. 9.10x6.10x0.90 inches. In Stock.
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US$ 351.61
Convert currencyUS$ 34.07 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 2nd edition. 328 pages. 9.25x6.25x0.75 inches. In Stock.
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US$ 365.00
Convert currencyUS$ 34.07 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. Like New. book.
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US$ 219.33
Convert currencyUS$ 57.93 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.
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US$ 219.33
Convert currencyUS$ 57.93 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.
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US$ 368.11
Convert currencyUS$ 11.77 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 352.
