Defect Recognition Image Processing Semiconductors by Donecker (7 results)
Published by Institute of Physics, 1998
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
- Hardcover
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
- Hardcover
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
- Hardcover
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Condition: New. pp. 548.
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Hardcover. Condition: Brand New. 1st edition. 524 pages. 9.75x6.50x1.25 inches. In Stock.
