Dependable Embedded Systems (26 results)

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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

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Condition: Hervorragend. Zustand: Hervorragend | Seiten: 624 | Sprache: Englisch | Produktart: Bücher | This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

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Paperback. Condition: new. Paperback. Are you building embedded systems that simply function. or systems that keep working when everything else begins to fail?Think about your current designs. When hardware starts degrading, when software behaves unexpectedly, or when real-world conditions push your system to its limits-what really happens? Does it recover. or does it collapse?This is exactly the question Dependable Embedded Systems Essentials challenges you to confront.Have you ever paused to ask yourself what truly makes an embedded system dependable? Is it just reliability? Or is it something deeper-a combination of reliability, availability, safety, integrity, and maintainability working together seamlessly?This book takes you beyond surface-level understanding and draws you into the core of resilient system design. It doesn't just explain concepts-it makes you question your approach: What is the real difference between a fault, an error, and a failure-and why does it matter?How can you detect problems before they escalate into system-wide breakdowns?What design strategies ensure your system continues operating, even under partial failure?Imagine designing a system that doesn't panic under stress-but adapts, responds, and survives.Through a practical and thought-provoking approach, you'll explore how hardware and software must be engineered together to handle uncertainty. You'll gain insight into fault models, redundancy techniques, real-time constraints, and error recovery strategies that transform fragile systems into robust ones.But this isn't just about preventing failure-it's about controlling it.What happens when failure becomes unavoidable?Do you allow a total shutdown. or design for graceful degradation?Can your system restart intelligently, preserve critical data, and resume operation without disruption?These are the decisions that separate average engineers from exceptional ones.You'll also uncover how timing guarantees, system architecture, and verification processes influence dependability. From safety-critical environments to everyday embedded applications, this book equips you with the mindset and methods needed to build systems that can be trusted in the real world.Because let's face it-embedded systems are no longer optional conveniences. They power vehicles, medical devices, industrial operations, and communication networks. And in these environments, failure isn't just inconvenient-it can be dangerous.So ask yourself: Are you designing for success. or designing for survival?Are your systems prepared for the unexpected. or vulnerable to it?Are you confident in your design choices. or leaving reliability to chance?This book challenges you to raise your standards.It pushes you to think deeper, design smarter, and anticipate problems before they happen. It equips you with the tools to build systems that don't just meet requirements-but exceed expectations under pressure.If you're ready to move beyond basic functionality.If you're ready to create systems that endure, adapt, and perform when it matters most.Then it's time to take control of how your embedded systems behave in the face of failure.Get your copy today and start building systems that never quit when it matters most. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. 624 pp. Englisch.

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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systemsDescribes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with.

Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 624 pp. Englisch.