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Developments Integrated Circuit Testing (1 results)
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Developments in Integrated Circuit Testing
Language: English
Published by London: Academic Press, 1987
ISBN 10: 0124967353 ISBN 13: 9780124967359
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. 440 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
