High Performance Memory Testing by Adams Dean (21 results)
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
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Hardcover. Condition: New. Hardcover, /no DJunused, minor shelf-wearFree of any markings and no writing. For Additional Information or pictures, Please Inquire.
Language: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Language: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
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Condition: New. pp. 266.
More imagesLanguage: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. High Performance Memory Testing | Design Principles, Fault Modeling and Self-Test | R. Dean Adams | Taschenbuch | xiv | Englisch | 2013 | Springer | EAN 9781475784749 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]c…om | Anbieter: preigu.
Language: English
Published by Springer US, Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories… were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Language: English
Published by Springer US, Copernicus 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were s…mall, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
- Signed
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Hardcover. Condition: New. SIGNED BY AUTHOR. Springer-Verlag New York Inc., United States, 2002. Hardcover. Condition: New. 2003 ed. Language: English. Seller Inventory # 0000019. Signed by Author(s).
Language: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
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Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer US Apr 2013 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past…because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 264 pp. Englisch.
Language: English
Published by Springer US Sep 2002 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermanyBuchWeltWeit Ludwig Meier e.K.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because… memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 266 pp. Englisch.
Language: English
Published by Springer US 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: moluna, Greven, , Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoi…ded in the past because memories were.
Language: English
Published by Springer US 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: moluna, Greven, , Germanymoluna
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which… were avoided in the past because memories were.
More imagesLanguage: English
Published by Copernicus 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
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Buch. Condition: Neu. High Performance Memory Testing | Design Principles, Fault Modeling and Self-Test | R. Dean Adams | Buch | xiv | Englisch | 2002 | Copernicus | EAN 9781402072550 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbiete…r: preigu Print on Demand.
Language: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
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Condition: New. Print on Demand pp. 266 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Language: English
Published by Springer US, Copernicus Sep 2002 2002
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because mem…ories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 266 pp. Englisch.
Language: English
Published by Springer US, Springer Apr 2013 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past beca…use memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 264 pp. Englisch.
Language: English
Published by Springer 2013
Series: Frontiers in Electronic Testing, Book 12 of 40. Book 12 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 266.
