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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (Frontiers in Electronic Testing, 43)
Book 22 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.09
US$ 16.10 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Taschenbuch. Condition: Neu. Models in Hardware Testing | Lecture Notes of the Forum in Honor of Christian Landrault | Hans-Joachim Wunderlich | Taschenbuch | xiv | Englisch | 2012 | Springer Netherland | EAN 9789400730939 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (Frontiers in Electronic Testing, 43)
Book 22 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 179.53
US$ 16.10 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
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Models in Hardware Testing : Lecture Notes of the Forum in Honor of Christian Landrault
Book 22 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer Netherlands, Springer Netherlands, 2012
ISBN 10: 9400730934 ISBN 13: 9789400730939
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (Frontiers in Electronic Testing (43))
Book 22 of 40: Frontiers in Electronic TestingUS$ 189.65
US$ 33.60 shipping
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault (Frontiers in Electronic Testing)
Book 22 of 40: Frontiers in Electronic TestingUS$ 218.72
US$ 33.60 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault
Book 22 of 40: Frontiers in Electronic TestingLanguage: English
Published by SPRINGER NATURE Dez 2009, 2009
ISBN 10: 9048132819 ISBN 13: 9789048132812
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. 257 pp. Englisch.
