New Methods Concurrent Checking by Gössel Michael (21 results)
New Methods Of Concurrent Checking (frontiers In Electronic Testing)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods Of Concurrent Checking: Preliminary Entry 42
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods Of Concurrent Checking: Preliminary Entry 42
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking
Goessel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
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New Methods of Concurrent Checking
Gossel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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New Methods of Concurrent Checking (Frontiers in Electronic Testing, 42)
Gössel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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More imagesLanguage: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. New Methods of Concurrent Checking | Michael Gössel (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9789048178766 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Language: English
Published by Springer, Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library…or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or cust…omers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.
New Methods of Concurrent Checking (Frontiers in Electronic Testing (42))
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
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New Methods of Concurrent Checking
Gossel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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New Methods of Concurrent Checking (Frontiers in Electronic Testing)
Gössel, Michael, Ocheretny, Vitaly, Sogomonyan, Egor, Marien
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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New Methods of Concurrent Checking
Goessel, Michael; Ocheretny, Vitaly; Sogomonyan, Egor; Marienfeld, Daniel
Language: English
Published by Springer 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Language: English
Published by Springer 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
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Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer Netherlands Okt 2010 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a…digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch.
Language: English
Published by SPRINGER NATURE Mai 2008 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermanyBuchWeltWeit Ludwig Meier e.K.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital… library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 182 pp. Englisch.
Language: English
Published by Springer Netherlands 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedT…he only book which desc.
Language: English
Published by Springer Netherlands 2008
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: moluna, Greven, , Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedT…he only book which desc.
Language: English
Published by Springer, Springer Okt 2010 2010
Series: Frontiers in Electronic Testing, Book 20 of 40. Book 20 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digi…tal library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.
