Novel Algorithms Fast Statistical by Singhee Amith (17 results)
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Taschenbuch. Condition: Neu. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits | Amith Singhee (u. a.) | Taschenbuch | Lecture Notes in Electrical Engineering | xv | Englisch | 2012 | Springer | EAN 9789400736870 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juerg…en[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, sinc…e they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.
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Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine le…arning, computational finance, number theory, actuarial.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computa…tional finance, number theory, actuarial.
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Condition: New. Print on Demand pp. 212 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this sc…enario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 212 pp. Englisch.
