Process Variations Probabilistic Integrated (23 results)

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    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

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    • Language: English

      Published by Springer, 2014

      1489988602 / 9781489988607

      • Softcover

      Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    • Language: English

      Published by Springer 2014-01-25, 2014

      1489988602 / 9781489988607

      • Softcover

      Seller: Chiron Media, Wallingford, United KingdomChiron Media

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    • Language: English

      Published by Springer, 2014

      1489988602 / 9781489988607

      • Softcover

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      Condition: New. pp. 268.

    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

      • Hardcover

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      Condition: New. pp. 268.

    • Language: English

      Published by Springer Verlag, 2014

      1489988602 / 9781489988607

      • Softcover

      Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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      Paperback. Condition: Brand New. 267 pages. 9.30x6.15x0.70 inches. In Stock.

    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

      • Hardcover

      Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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      Condition: New. In English.

    • Language: English

      Published by Springer Verlag, 2011

      144196620X / 9781441966209

      • Hardcover

      Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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      Hardcover. Condition: Brand New. 2012 edition. 265 pages. 9.00x6.25x0.75 inches. In Stock.

    • Language: English

      Published by Springer, 2014

      1489988602 / 9781489988607

      • Softcover

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

      • Hardcover

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    • Language: English

      Published by Springer, 2014

      1489988602 / 9781489988607

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    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

      • Hardcover
      • Print on Demand

      Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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    • Language: English

      Published by Springer New York, Springer US Nov 2011, 2011

      144196620X / 9781441966209

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      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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      Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 268 pp. Englisch.

    • Language: English

      Published by Springer Jan 2014, 2014

      1489988602 / 9781489988607

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      Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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      Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 268 pp. Englisch.

    • Language: English

      Published by Springer, 2014

      1489988602 / 9781489988607

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      • Print on Demand

      Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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      Condition: New. Print on Demand pp. 268.

    • Language: English

      Published by Springer New York, 2014

      1489988602 / 9781489988607

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      Seller: moluna, Greven, Germanymoluna

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      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects .

    • Language: English

      Published by Springer New York, 2011

      144196620X / 9781441966209

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      Seller: moluna, Greven, Germanymoluna

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      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects .

    • Language: English

      Published by Springer, 2014

      1489988602 / 9781489988607

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      Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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      Condition: New. PRINT ON DEMAND pp. 268.

    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

      • Hardcover
      • Print on Demand

      Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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      Condition: New. Print on Demand pp. 268.

    • Language: English

      Published by Springer, 2011

      144196620X / 9781441966209

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      Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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      Condition: New. PRINT ON DEMAND pp. 268.

    • Language: English

      Published by Springer New York, Springer US Jan 2014, 2014

      1489988602 / 9781489988607

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      • Print on Demand

      Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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      Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 268 pp. Englisch.

    • Language: English

      Published by Springer New York, Springer US Nov 2011, 2011

      144196620X / 9781441966209

      • Hardcover
      • Print on Demand

      Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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      Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 268 pp. Englisch.

    • Language: English

      Published by Humana, 2011

      144196620X / 9781441966209

      • Hardcover
      • Print on Demand

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.