Quantitative Atomic Resolution Electron Microscopy (10 results)

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  • Language: English

    Published by Academic Press, 2021

    0128246073 / 9780128246078

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  • Language: English

    Published by Academic Press, 2021

    0128246073 / 9780128246078

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  • Language: English

    Published by Academic Press, 2021

    0128246073 / 9780128246078

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  • Language: English

    Published by Academic Press, 2021

    0128246073 / 9780128246078

    • Hardcover

    Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

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  • Language: English

    Published by Elsevier Science Publishing Co Inc, US, 2021

    0128246073 / 9780128246078

    • Hardcover

    Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA

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    Hardback. Condition: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.…

  • Language: English

    Published by Elsevier Science Publishing Co Inc, US, 2021

    0128246073 / 9780128246078

    • Hardcover

    Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK

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    Hardback. Condition: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.…

  • Language: English

    Published by Academic Press, 2021

    0128246073 / 9780128246078

    • Hardcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Elsevier Science, 2021

    0128246073 / 9780128246078

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    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image proce.

  • Language: English

    Published by Elsevier Science & Technology, Academic Press, 2021

    0128246073 / 9780128246078

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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Englisch.…

  • Language: English

    Published by Elsevier Inc, 2021

    0128246073 / 9780128246078

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    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.…