Scratch Study Identification Detection by Liu Wei (1 results)

Author:

Title:

Refine with Advanced Search

scratch Study identification and detection of electronic components(Chinese Edition)
LIU WEI GUO WANG CHUN SHENG ZHANG TAO LIU JIAN QING
Language: Chinese
Published by Defense Industry Press Pub. Date :2007-01-01, 1991
7118047651 / 9787118047653
- Softcover
Seller: liu xing, Nanjing, JS, Chinaliu xing
5-star seller
Contact seller
Condition: New
US$ 60.88
US$ 18.00 shipping
Ships from China to U.S.A.
Quantity: 3 available
Soft cover. Condition: New. Language:Chinese.Author:LIU WEI GUO WANG CHUN SHENG ZHANG TAO LIU JIAN QING.Binding:Soft cover.Publisher:Defense Industry Press Pub. Date :2007-01-01.