Semiconductor Test Technology Application by Liu Xin (1 results)
Published by metallurgy Pub. Date :2006-11-01, 2000
- Softcover
Seller: liu xing, Nanjing, JS, Chinaliu xing
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US$ 57.64
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paperback. Condition: New. Language:Chinese.Publisher: metallurgy Pub. Date :2006-11 -01. The book is 11 chapters. Chapter 1 of the semiconductor micro-resistance measurement techniques are analyzed and compared various methods. the sheet resistance of domestic and international test methods are reviewed; Chapter 2 is a four-probe techniques to measure the sheet resistance analysis of the principle of the conventional straight-line four probe. an improved Vanderbilt Law and oblique style square Rymaszewski four-probe m.…
