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Software Defect Operational Profile by Kai Yuan Cai (26 results)
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Software Defect and Operational Profile Modeling (Paperback)
Published by Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10: 1461375592 ISBN 13: 9781461375593
Language: English
Paperback. Condition: new. Paperback. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Software Defect and Operational Profile Modeling (Hardcover)
Published by Kluwer Academic Publishers, Dordrecht, 1998
ISBN 10: 0792382595 ISBN 13: 9780792382591
Language: English
Hardcover. Condition: new. Hardcover. This text presents a systematic discussion of three important questions in software reliability engineering: how to estimate the number of software defects; how to model software operational profiles; and how to estimate software failure rate and quantify software correctness when testing reveals no failures. Researchers will find that this book presents a reasonable summary of related topics and contains a modest amount of original and new research results. Although, due to the space limitation, methods discussed in the main text are selected, a separate section, "Remarks and Problems", is created for each chapter to address ideas and references. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Software Defect and Operational Profile Modeling (International Series in Software Engineering)
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Software Defect and Operational Profile Modeling
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Software Defect and Operational Profile Modeling (International Series in Software Engineering, 4)
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Software Defect and Operational Profile Modeling
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Condition: New. pp. 292.
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Software Defect and Operational Profile Modeling
Published by Springer US, Springer New York Aug 1998, 1998
ISBN 10: 0792382595 ISBN 13: 9780792382591
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Add to basketBuch. Condition: Neu. Neuware -also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch.
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Software Defect and Operational Profile Modeling
Published by Springer US, Springer New York, 1998
ISBN 10: 0792382595 ISBN 13: 9780792382591
Language: English
US$ 268.94
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Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1.
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Software Defect and Operational Profile Modeling (Paperback)
Published by Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10: 1461375592 ISBN 13: 9781461375593
Language: English
US$ 412.48
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Add to basketPaperback. Condition: new. Paperback. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Software Defect and Operational Profile Modeling (Hardcover)
Published by Kluwer Academic Publishers, Dordrecht, 1998
ISBN 10: 0792382595 ISBN 13: 9780792382591
Language: English
US$ 437.03
Convert currencyUS$ 37.00 shipping from Australia to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: new. Hardcover. This text presents a systematic discussion of three important questions in software reliability engineering: how to estimate the number of software defects; how to model software operational profiles; and how to estimate software failure rate and quantify software correctness when testing reveals no failures. Researchers will find that this book presents a reasonable summary of related topics and contains a modest amount of original and new research results. Although, due to the space limitation, methods discussed in the main text are selected, a separate section, "Remarks and Problems", is created for each chapter to address ideas and references. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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US$ 217.06
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Me.
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Me.
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Software Defect and Operational Profile Modeling
Published by Springer US Aug 1998, 1998
ISBN 10: 0792382595 ISBN 13: 9780792382591
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 257.95
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Add to basketBuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 292 pp. Englisch.
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Software Defect and Operational Profile Modeling
Published by Springer US Okt 2012, 2012
ISBN 10: 1461375592 ISBN 13: 9781461375593
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 257.95
Convert currencyUS$ 26.92 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 292 pp. Englisch.
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Software Defect and Operational Profile Modeling
Published by Springer US, Springer New York Okt 2012, 2012
ISBN 10: 1461375592 ISBN 13: 9781461375593
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
US$ 257.95
Convert currencyUS$ 70.22 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch.
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Add to basketCondition: New. Print on Demand pp. 292 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Add to basketCondition: New. PRINT ON DEMAND pp. 292.
