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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Published by Chapman and Hall/CRC (edition 1), 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
Hardcover. Condition: Good. 1. Ship within 24hrs. Satisfaction 100% guaranteed. APO/FPO addresses supported.
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
Condition: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Published by Chapman and Hall/CRC 2015-11-24, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
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Convert currencyUS$ 20.92 shipping from United Kingdom to U.S.A.Quantity: 5 available
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Spatial Point Patterns : Methodology and Applications With R
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
Condition: New.
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Spatial Point Patterns : Methodology and Applications With R
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
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Spatial Point Patterns : Methodology and Applications With R
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/CRC Interdisciplinary Statistics)
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 165.07
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Spatial Point Patterns : Methodology and Applications With R
Published by Chapman and Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
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Add to basketHardcover. Condition: Brand New. 810 pages. 9.00x7.00x2.00 inches. In Stock.
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Spatial Point Patterns : Methodology and Applications with R
Published by Chapman And Hall/CRC, 2015
ISBN 10: 1482210207 ISBN 13: 9781482210200
Language: English
US$ 165.62
Convert currencyUS$ 80.23 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketBuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.
